Improving Test-Time Scaling with Adaptive Looped Transformers· 通过自适应循环Transformer提升测试时扩展性

Looped transformers have demonstrated promising parameter efficiency by reusing layers for latent computation. Prior studies compare looped and non-looped models at matched parameters or per-token FLOPs. However, to the best of our knowledge, whether looping improves test-time scaling as outputs grow longer remains underexplored. Through post-training looped transformers, we study the accuracy-compute slope, measured as the accuracy gain per doubling of test-time decoding FLOPs. We find that existing looped transformers often yield steeper slopes than their non-looped baseline, yet underperform it at matched compute. While fixed-depth looping spends extra iterations on every token, our analysis shows that many tokens do not benefit from extra iterations. We therefore propose TaH2, which en